Central Composite Designs


  • Etch Rate Experiment (Myers & Montgomery, 2002)

    Etch Rate Experiment (Myers & Montgomery, 2002)

    This case study explores the Myers and Montgomery (2002) etch rate experiment using response surface methodology (RSM) to optimise plasma etching in semiconductor manufacturing. A central composite design is used to model the effect of RF power and chamber pressure on etch rate.


  • Design of Experiments explained

    Design of Experiments explained

    Design of Experiments (DoE) is a powerful method for improving products and processes through structured testing. This post explains what DoE is, who uses it, and how to apply full factorial, Taguchi, RSM, and mixture designs — including tools, examples, and visual insights.


  • Central Composite Designs explained

    Central Composite Designs explained

    Learn how Central Composite Designs (CCDs) enhance product development through efficient optimisation, predictive modelling, and engineering-focused experimentation. Discover real-world applications and how Product Development Engineers Ltd can help you design, analyse, and apply CCDs effectively.


  • Design Success with DoE

    Product Development Engineers Ltd When developing a new product, guesswork is costly. At Product Development Engineers Ltd, we help businesses around the world innovate smarter using advanced Design of Experiments (DoE) techniques. 🔍 What’s covered in this video: 🧠 Why DoE matters: Design of Experiments accelerates product development by reducing trial-and-error. It brings structure, speed,…