Product Development Engineers Ltd

Engineering Statistics

  • Etch Rate Experiment (Myers & Montgomery, 2002)

    Etch Rate Experiment (Myers & Montgomery, 2002)

    This case study explores the Myers and Montgomery (2002) etch rate experiment using response surface methodology (RSM) to optimise plasma etching in semiconductor manufacturing. A central composite design is used to model the effect of RF power and chamber pressure on etch rate.

  • Central Composite Designs explained

    Central Composite Designs explained

    Learn how Central Composite Designs (CCDs) enhance product development through efficient optimisation, predictive modelling, and engineering-focused experimentation. Discover real-world applications and how Product Development Engineers Ltd can help you design, analyse, and apply CCDs effectively.